Crop yield prediction using machine learning: A systematic...

Computers and Electronics in Agriculture 2020 / 10 Vol. 177

Crop yield prediction using machine learning: A systematic literature review

van Klompenburg, Thomas, Kassahun, Ayalew, Catal, Cagatay
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Volume:
177
Journal:
Computers and Electronics in Agriculture
DOI:
10.1016/j.compag.2020.105709
Date:
October, 2020
File:
PDF, 2.24 MB
2020
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