[IEEE 2020 IEEE International Conference On Artificial...

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[IEEE 2020 IEEE International Conference On Artificial Intelligence Testing (AITest) - Oxford, United Kingdom (2020.8.3-2020.8.6)] 2020 IEEE International Conference On Artificial Intelligence Testing (AITest) - Controlled time series generation for automotive software-in-the-loop testing using GANs

Parthasarathy, Dhasarathy, Backstrom, Karl, Henriksson, Jens, Einarsdottir, Solrun
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Year:
2020
DOI:
10.1109/AITEST49225.2020.00013
File:
PDF, 1.40 MB
2020
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