[IEEE 2020 Annual Reliability and Maintainability Symposium (RAMS) - Palm Springs, CA, USA (2020.1.27-2020.1.30)] 2020 Annual Reliability and Maintainability Symposium (RAMS) - A Hierarchical Bayesian Model for Reliability Growth Projection
Wayne, Martin, Blood, Jonathan, Ellner, PaulYear:
2020
DOI:
10.1109/RAMS48030.2020.9153696
File:
PDF, 232 KB
2020