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[IEEE 2020 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA) - Hsinchu, Taiwan (2020.8.10-2020.8.13)] 2020 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA) - Scaling of Split-Gate Flash Memory for Embedded Controllers and Machine Learning Applications
Do, Nhan, Lemke, Steven, Tran, Hieu, Tiwari, Vipin, Reiten, MarkYear:
2020
DOI:
10.1109/VLSI-TSA48913.2020.9203593
File:
PDF, 274 KB
2020