[IEEE 2020 IEEE International Test Conference India (ITC...

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[IEEE 2020 IEEE International Test Conference India (ITC India) - Bangalore, India (2020.7.12-2020.7.14)] 2020 IEEE International Test Conference India - Efficient Fault Detection and Diagnosis of Digital Microfluidic Biochip Using Multiple Electrodes Actuation

Ghosh, Sourav, Maity, Dolan, Chowdhury, Arijit, Roy, Surajit Kumar, Giri, Chandan
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Year:
2020
DOI:
10.1109/itcindia49857.2020.9171793
File:
PDF, 114 KB
2020
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