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Defect Detection in Printed Circuit Boards Using You-Only-Look-Once Convolutional Neural Networks
Adibhatla, Venkat Anil, Chih, Huan-Chuang, Hsu, Chi-Chang, Cheng, Joseph, Abbod, Maysam F., Shieh, Jiann-ShingVolume:
9
Journal:
Electronics
DOI:
10.3390/electronics9091547
Date:
September, 2020
File:
PDF, 3.49 MB
2020