A metrological approach to the time of flight diffraction...

A metrological approach to the time of flight diffraction method (ToFD)

Mayworm, R.C., Alvarenga, A.V., Costa-Felix, R.P.B.
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Volume:
167
Journal:
Measurement
DOI:
10.1016/j.measurement.2020.108298
Date:
January, 2021
File:
PDF, 6.15 MB
2021
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