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[IEEE 2020 33rd Symposium on Integrated Circuits and Systems Design (SBCCI) - Campinas, Brazil (2020.8.24-2020.8.28)] 2020 33rd Symposium on Integrated Circuits and Systems Design (SBCCI) - Evidence of a Dynamic Fault Model in the DICE Radiation-Hardened Cell
da Cruz, William Souza, Dutertre, Jean-Max, Rigaud, Jean-Baptiste, Hubert, GuillaumeYear:
2020
DOI:
10.1109/sbcci50935.2020.9189897
File:
PDF, 463 KB
2020