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Experimental investigation and modeling of electrical properties for phenol red thin film deposited on silicon using back propagation artificial neural network
Ali, H.A.M., El-Zaidia, E.F.M., Mohamed, R.A.Volume:
67
Journal:
Chinese Journal of Physics
DOI:
10.1016/j.cjph.2020.07.018
Date:
October, 2020
File:
PDF, 2.94 MB
2020