Rapid and non-destructive seed viability prediction using...

Computers and Electronics in Agriculture 2020 / 10 Vol. 177

Rapid and non-destructive seed viability prediction using near-infrared hyperspectral imaging coupled with a deep learning approach

Ma, Te, Tsuchikawa, Satoru, Inagaki, Tetsuya
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Volume:
177
Journal:
Computers and Electronics in Agriculture
DOI:
10.1016/j.compag.2020.105683
Date:
October, 2020
File:
PDF, 2.56 MB
2020
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