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Rapid and non-destructive seed viability prediction using near-infrared hyperspectral imaging coupled with a deep learning approach
Ma, Te, Tsuchikawa, Satoru, Inagaki, TetsuyaVolume:
177
Journal:
Computers and Electronics in Agriculture
DOI:
10.1016/j.compag.2020.105683
Date:
October, 2020
File:
PDF, 2.56 MB
2020