DeepScratch: Single-cell based topological metrics of scratch wound assays
Javer, Avelino, Rittscher, Jens, Sailem, Heba Z.Volume:
18
Year:
2020
Journal:
Computational and Structural Biotechnology Journal
DOI:
10.1016/j.csbj.2020.08.018
File:
PDF, 2.48 MB
2020