Insight into traps at Al2O3/p-GaN metal-oxide-semiconductor interface fabricated on free-standing GaN substrate
Sang, Liwen, Ren, Bing, Nabatame, Toshihide, Sumiya, Masatomo, Liao, MeiyongVolume:
853
Journal:
Journal of Alloys and Compounds
DOI:
10.1016/j.jallcom.2020.157356
Date:
February, 2021
File:
PDF, 1.60 MB
2021