Characterization of edge dislocation density through X-ray...

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Journal of Crystal Growth 2020 / 9

Characterization of edge dislocation density through X-ray diffraction rocking curves

Li, Yangfeng, Yan, Shen, Hu, Xiaotao, Song, Yimeng, Deng, Zhen, Du, Chunhua, Wang, Wenqi, Ma, Ziguang, Wang, Lu, Jia, Haiqiang, Wang, Wenxin, Zhou, Junming, Jiang, Yang, Chen, Hong
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Journal:
Journal of Crystal Growth
DOI:
10.1016/j.jcrysgro.2020.125893
Date:
September, 2020
File:
PDF, 570 KB
2020
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