Modeling and Mechanism of Enhanced Performance of In-Ga-Zn-O Thin-Film Transistors with Nanometer Thicknesses under Temperature Stress
Dai, Chaoqi, Qi, Guoqiang, Qiao, Hai, Wang, Weiliang, Xiao, Han, Hu, Yongbin, Guo, Liqiang, Dai, Mingzhi, Wang, Pengjun, Webster, Thomas J.Journal:
The Journal of Physical Chemistry C
DOI:
10.1021/acs.jpcc.0c05911
Date:
October, 2020
File:
PDF, 2.31 MB
2020