Analytical model for rectangular side-by-side probe in...

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Nondestructive Testing And Evaluation 2020 / 09

Analytical model for rectangular side-by-side probe in eddy-current non-destructive inspection

Dehui, Wu, Chen, Wenxiong, Yang, Jiaxin, Yang, Fan
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Journal:
Nondestructive Testing and Evaluation
DOI:
10.1080/10589759.2020.1813283
Date:
September, 2020
File:
PDF, 1.57 MB
2020
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