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[IEEE 2020 21st International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices (EDM) - Chemal, Russia (2020.6.29-2020.7.3)] 2020 21st International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices (EDM) - Experimental Study of the Buried Vias Effect on Reflection Symmetric Modal Filter Performance
Zhechev, Yevgeniy S.Year:
2020
DOI:
10.1109/EDM49804.2020.9153335
File:
PDF, 342 KB
2020