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[IEEE 2020 IEEE 13th International Conference on Software Testing, Validation and Verification (ICST) - Porto, Portugal (2020.10.24-2020.10.28)] 2020 IEEE 13th International Conference on Software Testing, Validation and Verification (ICST) - STICCER: Fast and Effective Database Test Suite Reduction Through Merging of Similar Test Cases
Alsharif, Abdullah, Kapfhammer, Gregory M., McMinn, PhilYear:
2020
DOI:
10.1109/ICST46399.2020.00031
File:
PDF, 227 KB
2020