[IEEE 2020 IEEE 29th International Symposium on Industrial...

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[IEEE 2020 IEEE 29th International Symposium on Industrial Electronics (ISIE) - Delft, Netherlands (2020.6.17-2020.6.19)] 2020 IEEE 29th International Symposium on Industrial Electronics (ISIE) - A comparative example between the use of PCA and MDS for image classification

Hernandez, Wilmar, Mendez, Alfredo, Flor-Unda, Omar, Gonzalez-Posada, Vicente, Jimenez, Jose Luis, Sergiyenko, Oleg, Rodriguez-Quinonez, Julio C., Ivanov, Mykhailo, Camejo, Ivan Menes, Kolendovska, Ma
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Year:
2020
DOI:
10.1109/ISIE45063.2020.9152565
File:
PDF, 1.11 MB
2020
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