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Silicon Surface Passivation by Atomic Layer Deposited Hafnium Oxide Films: Trap States Investigation Using Constant Voltage Stress Studies
Tomer, Shweta, Devi, Meenakshi, Kumar, Abhishek, Laxmi, Subha, Rauthan, C. M. S., Vandana,Year:
2020
Journal:
IEEE Journal of Photovoltaics
DOI:
10.1109/JPHOTOV.2020.3022686
File:
PDF, 960 KB
2020