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[IEEE 2020 Annual Reliability and Maintainability Symposium (RAMS) - Palm Springs, CA, USA (2020.1.27-2020.1.30)] 2020 Annual Reliability and Maintainability Symposium (RAMS) - Origin of l/f Noise-Active Degradation Generating Entropy
Feinberg, AlecYear:
2020
DOI:
10.1109/RAMS48030.2020.9153628
File:
PDF, 113 KB
2020