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[IEEE 2020 Annual Reliability and Maintainability Symposium (RAMS) - Palm Springs, CA, USA (2020.1.27-2020.1.30)] 2020 Annual Reliability and Maintainability Symposium (RAMS) - Reliability-Test Planning Considering Multiple Failure Mechanisms and System Levels â an Approach for Identifying the Optimal System-Test Level, Type, and Configuration with Regard to Individual Cost and Time Constraints
Grundler, Alexander, Dazer, Martin, Bertsche, BerndYear:
2020
DOI:
10.1109/RAMS48030.2020.9153678
File:
PDF, 232 KB
2020