Analysis of High-Frequency Measurement of Transistors Along...

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IEEE Transactions on Electron Devices 2020

Analysis of High-Frequency Measurement of Transistors Along With Electromagnetic and SPICE Cosimulation

Fregonese, Sebastien, Cabbia, Marco, Yadav, Chandan, Deng, Marina, Panda, Soumya Ranjan, De Matos, Magali, Celi, Didier, Chakravorty, Anjan, Zimmer, Thomas
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Year:
2020
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/TED.2020.3022603
File:
PDF, 3.54 MB
2020
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