Reliability of Logic-in-Memory Circuits in Resistive Memory...

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IEEE Transactions on Electron Devices 2020

Reliability of Logic-in-Memory Circuits in Resistive Memory Arrays

Zanotti, Tommaso, Zambelli, Cristian, Puglisi, Francesco Maria, Milo, Valerio, Perez, Eduardo, Mahadevaiah, Mamathamba K., Ossorio, Oscar G., Wenger, Christian, Pavan, Paolo, Olivo, Piero, Ielmini, Da
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Year:
2020
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/TED.2020.3025271
File:
PDF, 1.44 MB
2020
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