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Fast and Reliable Method for Identifying Fault Type and Faulted Phases Using Band Limited Transient Currents
Wijekoon, Jagannath, Rajapakse, Athula D., Mohamed Haleem, NaushathYear:
2020
Journal:
IEEE Transactions on Power Delivery
DOI:
10.1109/TPWRD.2020.3027793
File:
PDF, 1.60 MB
2020