[IEEE 2020 31st Annual SEMI Advanced Semiconductor...

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[IEEE 2020 31st Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) - Saratoga Springs, NY, USA (2020.8.24-2020.8.26)] 2020 31st Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) - Excursion Prevention Strategy to Increase Chip Performance by Wafer Intra-Field CD Control Using Photomask Tuning

Sharoni, Ofir, Sufrin, Yael, Cohen, Avi, Scheruebl, Thomas, Seltmann, Rolf, Samy, Aravind Narayana, Thamm, Thomas
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Year:
2020
DOI:
10.1109/asmc49169.2020.9185321
File:
PDF, 323 KB
2020
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