[IEEE 2020 Conference on Precision Electromagnetic Measurements (CPEM 2020) - Denver (Aurora), CO, USA (2020.8.24-2020.8.28)] 2020 Conference on Precision Electromagnetic Measurements (CPEM) - A Simplified Calculation Model of MFL Signal of Defect Based on Lift-off Value
Peng, Lisha, Huang, Songling, Wang, Shen, Zhao, WeiYear:
2020
DOI:
10.1109/cpem49742.2020.9191696
File:
PDF, 713 KB
2020