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[IEEE 2020 Conference on Precision Electromagnetic Measurements (CPEM 2020) - Denver (Aurora), CO, USA (2020.8.24-2020.8.28)] 2020 Conference on Precision Electromagnetic Measurements (CPEM) - Nonlinear uncertainty propagation of on-wafer mixed-mode S parameter measurements using Multimode-TRL calibration
Pham, Thi Dao, Allal, Djamel, Ziade, Francois, Bergeault, EricYear:
2020
DOI:
10.1109/cpem49742.2020.9191841
File:
PDF, 193 KB
2020