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Annealing temperature effect on the Cu-Cu bonding energy for 3D-IC integration
Eun-Jung Jang, Jae-Won Kim, Bioh Kim, Thorsten Matthias, Young-Bae ParkVolume:
17
Language:
english
Pages:
5
DOI:
10.1007/s12540-011-0214-0
Date:
February, 2011
File:
PDF, 1.06 MB
english, 2011