Transmission electron microscopy observation of a single Ni...

International Journal of Precision Engineering and Manufacturing 2010 / 06 Vol. 11; Iss. 3

Transmission electron microscopy observation of a single Ni dot fabricated using scanning tunneling microscopy

Chul-Un Hong, Hyung-Sub Kang, Seong-Jong Kim, Sung-Jun Kang, Gi-Beum Kim
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Volume:
11
Language:
english
Pages:
4
DOI:
10.1007/s12541-010-0054-8
Date:
June, 2010
File:
PDF, 1.45 MB
english, 2010
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