Effect of CuIn1−xAlxSe2 (CIAS) thin film thickness and...

Bulletin of Materials Science 2020 / 12 Vol. 43; Iss. 1

Effect of CuIn1−xAlxSe2 (CIAS) thin film thickness and diode annealing temperature on Al/p-CIAS Schottky diode

Parihar, Usha, Ray, Jaymin, Panchal, C J, Padha, Naresh
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
43
Journal:
Bulletin of Materials Science
DOI:
10.1007/s12034-020-02245-w
Date:
December, 2020
File:
PDF, 1020 KB
2020
Conversion to is in progress
Conversion to is failed