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[IEEE 2020 25th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA) - Vienna, Austria (2020.9.8-2020.9.11)] 2020 25th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA) - A Systematic Assessment of Embedded Neural Networks for Object Detection
Verucchi, Micaela, Brilli, Gianluca, Sapienza, Davide, Verasani, Mattia, Arena, Marco, Gatti, Francesco, Capotondi, Alessandro, Cavicchioli, Roberto, Bertogna, Marko, Solieri, MarcoYear:
2020
DOI:
10.1109/ETFA46521.2020.9212130
File:
PDF, 582 KB
2020