Extended Dual-Focus Microscopy for Ratiometric-Based 3D...

Applied Sciences 2020 / 09 Vol. 10; Iss. 18

Extended Dual-Focus Microscopy for Ratiometric-Based 3D Movement Tracking

Lee, Seohyun, Kim, Hyuno, Higuchi, Hideo
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Volume:
10
Journal:
Applied Sciences
DOI:
10.3390/app10186243
Date:
September, 2020
File:
PDF, 1.48 MB
2020
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