X-ray metal material evaluation using an SOI pixel detector

Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment 2020 / 11 Vol. 979

X-ray metal material evaluation using an SOI pixel detector

Mitsui, S., Sasaki, T., Shinya, M., Arai, Y., Miyoshi, T., Nishimura, R.
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Volume:
979
Journal:
Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
DOI:
10.1016/j.nima.2020.164376
Date:
November, 2020
File:
PDF, 1.48 MB
2020
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