A data-driven method for enhancing the image-based...

A data-driven method for enhancing the image-based automatic inspection of IC wire bonding defects

Chen, Junlong, Zhang, Zijun, Wu, Feng
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Journal:
International Journal of Production Research
DOI:
10.1080/00207543.2020.1821928
Date:
September, 2020
File:
PDF, 3.79 MB
2020
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