Reduced screening of remote phonon scattering in thin-film...

Applied Physics Letters 2020 / 10 Vol. 117; Iss. 14

Reduced screening of remote phonon scattering in thin-film transistors caused by gate-electrode/gate-dielectric interlayer

Ma, Y. X., Tang, W. M., Lai, P. T.
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Volume:
117
Journal:
Applied Physics Letters
DOI:
10.1063/5.0021370
Date:
October, 2020
File:
PDF, 1.56 MB
2020
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