Application of Interference Microscopy and IR Microscopy...

Chemical Engineering & Technology 2007 Vol. 30; Iss. 8

Application of Interference Microscopy and IR Microscopy for Characterizing and Investigating Mass Transport in Nanoporous Materials

L. Heinke, C. Chmelik, P. Kortunov, D. M. Ruthven, D. B. Shah, S. Vasenkov, J. Kärger
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Volume:
30
Year:
2007
Language:
english
Pages:
8
DOI:
10.1002/ceat.200700093
File:
PDF, 811 KB
english, 2007
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