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Topology of conductive clusters in sputtered high-quality VO 2 thin films on the brink of percolation threshold during insulator-to-metal and metal-to-insulator transitions
Koughia, Cyril, Gunes, Ozan, Zhang, Chunzi, Wen, Shi-Jie, Wong, Rick, Yang, Qiaoqin, Kasap, Safa O.Volume:
38
Journal:
Journal of Vacuum Science & Technology A
DOI:
10.1116/6.0000443
Date:
December, 2020
File:
PDF, 3.17 MB
2020