XPS, AES and UPS investigation of SnO2/Si and DFT based...

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Surface Review and Letters 2020 / 09

XPS, AES and UPS investigation of SnO2/Si and DFT based Theoretical Study within the mBJ-GGA Scheme

Mokadem, A., Bouslama, M., Kharoubi, B., Ouerdane, A., Khenata, R., Guezzoul, M., Baizid, A., Abdelkrim, M., Bensassi, K. B., Naqib, S. H., Wang, Xiaotian
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Journal:
Surface Review and Letters
DOI:
10.1142/S0218625X20500481
Date:
September, 2020
File:
PDF, 898 KB
2020
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