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Studying phase change memory devices by coupling scanning precession electron diffraction and energy dispersive X-ray analysis
Henry, Loïc, Bernier, Nicolas, Jacob, Martin, Navarro, Gabriele, Clément, Laurent, Rouvière, Jean-Luc, Robin, EricVolume:
201
Journal:
Acta Materialia
DOI:
10.1016/j.actamat.2020.09.033
Date:
December, 2020
File:
PDF, 2.32 MB
2020