Precise chemical state analyses of ultrathin hafnium films...

Surface Science 2020 / 11 Vol. 701

Precise chemical state analyses of ultrathin hafnium films deposited on clean Si(111)-7 × 7 surface using high-resolution core-level photoelectron spectroscopy

Kakiuchi, T., Matoba, T., Koyama, D., Yamamoto, Y., Kato, D., Yoshigoe, A.
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Volume:
701
Journal:
Surface Science
DOI:
10.1016/j.susc.2020.121691
Date:
November, 2020
File:
PDF, 2.38 MB
2020
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