Erratum: “Crystallite size dependent exchange bias in...

Journal of Applied Physics 2020 / 07 Vol. 128; Iss. 4

Erratum: “Crystallite size dependent exchange bias in MgFe 2 O 4 thin films on Si(100)” [J. Appl. Phys. 124, 053901 (2018)]

Mallick, Kingshuk, Anil Kumar, P. S.
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Volume:
128
Journal:
Journal of Applied Physics
DOI:
10.1063/1.5135710
Date:
July, 2020
File:
PDF, 654 KB
2020
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