Intensity dependent deflection spectroscopy for the...

Intensity dependent deflection spectroscopy for the characterization of absorption mechanisms in semiconductors

Dickmann, Walter, Götze, Tom, Bieler, Mark, Kroker, Stefanie
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Volume:
128
Journal:
Journal of Applied Physics
DOI:
10.1063/5.0012702
Date:
July, 2020
File:
PDF, 2.46 MB
2020
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