[IEEE 2020 8th International Conference on Reliability, Infocom Technologies and Optimization (Trends and Future Directions) (ICRITO) - Noida, India (2020.6.4-2020.6.5)] 2020 8th International Conference on Reliability, Infocom Technologies and Optimization (Trends and Future Directions) (ICRITO) - Application-based Attention Mechanisms in Deep Learning
Gupta, Shailja, Kaur, Manpreet, Lakra, Sachin, Khattar, MayankYear:
2020
DOI:
10.1109/ICRITO48877.2020.9197981
File:
PDF, 619 KB
2020