Low-Noise Si-JFETs Enhanced by Split-Channel Concept
Sturm-Rogon, Leonhard, Neumeier, Karl, Kutter, ChristophVolume:
67
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/TED.2020.3026661
Date:
November, 2020
File:
PDF, 2.23 MB
2020