Origin and Suppression of Beam Damage-Induced Oxygen-K Edge Artifact from γ-Al2O3 using Cryo-EELS
Ayoola, Henry O., Li, Cheng-Han, House, Stephen D., Bonifacio, Cecile S., Kisslinger, Kim, Jinschek, Joerg, Saidi, Wissam A., Yang, Judith C.Volume:
219
Journal:
Ultramicroscopy
DOI:
10.1016/j.ultramic.2020.113127
Date:
December, 2020
File:
PDF, 2.55 MB
2020