The effect of thickness on surface structure of rf sputtered TiO2 thin films by XPS, SEM/EDS, AFM and SAM
Güzelçimen, Feyza, Tanören, Bükem, Ãetinkaya, ÃaÄlar, Kaya, Meltem Dönmez, Efkere, H. Ä°brahim, Ãzen, Yunus, Bingöl, DoÄukan, Sirkeci, Merve, Kınacı, BarıÅ, Ãnlü, M. Burçin, ÃzçeliJournal:
Vacuum
DOI:
10.1016/j.vacuum.2020.109766
Date:
September, 2020
File:
PDF, 14.45 MB
2020