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[IEEE 2020 42nd Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC) in conjunction with the 43rd Annual Conference of the Canadian Medical and Biological Engineering Society - Montreal, QC, Canada (2020.7.20-2020.7.24)] 2020 42nd Annual International Conference of the IEEE Engineering in Medicine & Biology Society (EMBC) - Automatic detection of artifacts in EEG by combining deep learning and histogram contour processing
Bahador, Nooshin, Erikson, Kristo, Laurila, Jouko, Koskenkari, Juha, Ala-Kokko, Tero, Kortelainen, JukkaYear:
2020
DOI:
10.1109/embc44109.2020.9175711
File:
PDF, 1.58 MB
2020