A memory window expression to evaluate the endurance of...

Applied Physics Letters 2020 / 10 Vol. 117; Iss. 15

A memory window expression to evaluate the endurance of ferroelectric FETs

Zagni, Nicolò, Pavan, Paolo, Alam, Muhammad A.
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Volume:
117
Journal:
Applied Physics Letters
DOI:
10.1063/5.0021081
Date:
October, 2020
File:
PDF, 1.07 MB
2020
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