Implementation of a Sinusoidal Raster Scan for High-Speed...

Implementation of a Sinusoidal Raster Scan for High-Speed Atomic Force Microscopy

Otieno, Luke Oduor, Lee, Yong Joong, Alunda, Bernard Ouma
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Volume:
77
Journal:
Journal of the Korean Physical Society
DOI:
10.3938/jkps.77.605
Date:
October, 2020
File:
PDF, 3.35 MB
2020
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