![](/img/cover-not-exists.png)
Implementation of a Sinusoidal Raster Scan for High-Speed Atomic Force Microscopy
Otieno, Luke Oduor, Lee, Yong Joong, Alunda, Bernard OumaVolume:
77
Journal:
Journal of the Korean Physical Society
DOI:
10.3938/jkps.77.605
Date:
October, 2020
File:
PDF, 3.35 MB
2020