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Pâ182: A Numerical Analysis of Current Efficiency Hump at Low Grey in the OLED Devices
Cho, Hyung Uk, Kim, Bo Woon, Lee, Jun Young, Cho, Young Mi, Baek, Seung In, Kim, Yong JoVolume:
51
Journal:
SID Symposium Digest of Technical Papers
DOI:
10.1002/sdtp.14325
Date:
August, 2020
File:
PDF, 1.19 MB
2020